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Volumn 81, Issue 5, 2010, Pages

Multiphonon-induced charge trapping-detrapping and damage in insulators

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EID: 77954804452     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.81.054307     Document Type: Article
Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.