Charge trapping in dielectrics

Microscopy and Microanalysis

Volumn 10, Issue 6, 2004, Pages 691-696

  Bonnelle, C ^a  

^a Universit Pierre et Marie Curie Paris 6   (France)

Author keywords

Cathodoluminescence; Charge effect; Defect states; Dielectric; X ray emission

Indexed keywords

EID: 11244353348     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040620     Document Type: Conference Paper

References (8)

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