AFM observation of diamond indenters after oxidation at elevated temperatures

Diamond and Related Materials

Volumn 19, Issue 11, 2010, Pages 1348-1353

  Wheeler, J M ^a   Oliver, R A ^a   Clyne, T W ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Berkovich and AFM; Diamond; Indentation; Oxidation

Indexed keywords

AFM; AFM OBSERVATION; BERKOVICH DIAMOND INDENTER; COMMERCIAL PURITY; DIAMOND INDENTER; ELEVATED TEMPERATURE; HIGH TEMPERATURE INDENTATION; INDENTERS; OXIDATIVE ETCHING; THERMOMECHANICAL DAMAGE; TIP RADIUS;

ARGON; ATOMIC FORCE MICROSCOPY; DIAMONDS; OXIDATION; VICKERS HARDNESS TESTING;

ATMOSPHERIC TEMPERATURE;

EID: 77957369867     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2010.07.004     Document Type: Article

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