A laboratory X-ray microbeam for combined X-ray diffraction and fluorescence measurements

Journal of Applied Crystallography

Volumn 43, Issue 5 PART 1, 2010, Pages 1131-1133

  Rouziere S ^a   Jourdanneau, E ^a   Kasmi, B ^a   Joly, P ^a   Petermann, D ^a   Albouy, P A ^a  

^a UNIVERSITÉ PARIS SUD   (France)

Author keywords

instrumentation; materials mapping; microbeams; X ray diffraction; X ray fluorescence

Indexed keywords

FLUORESCENCE MEASUREMENTS; INSTRUMENTATION; LOW-INTENSITY; MAPPING STUDIES; MICROBEAMS; MICROSCOPIC LENGTH SCALE; MONOCHROMATIC X-RAYS; PROTOTYPE INSTRUMENT; SIMULTANEOUS ACQUISITION; X-RAY FLUORESCENCE; X-RAY SOURCES;

DIFFRACTION; FLUORESCENCE; INSTRUMENTS; MAPPING; X RAY DIFFRACTION;

X RAYS;

EID: 77957338437     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810027901     Document Type: Article

References (8)

1. Bjeoumikhov, A., Langhoff, N., Rabe, J. & Wedell, R. (2004). X-ray Spectrom. 33, 312-316.
2. Cornaby, S., Reyes-Mena, S., Pew, H. K., Moody, P., Hughes, T., Stradling, A. &Knight, L. (2001). J. X-ray Sci. Technol. 9, 85-87.
3. David, C., Nohammer, B. & Ziegler, E. (2001). Appl. Phys. Lett. 79, 1088-1090.
4. Koch, A., Raven, C., Spanne, P. & Snigirev, A. (1998). J. Opt. Soc. Am. A, 15, 1940-1951.
5. Lengeler, B., Schroer, C. G., Richwin, M., Tümmler, J., Drakopoulos, M., Snigirev, A. & Snigireva, I. (1999). Appl. Phys. Lett. 74, 3924-3926.
6. Livet, F., Bley, F., Mainville, J., Caudron, R., Mochrie, S. G. J., Geissler, E., Abernathy, D., Grübel, G. & Sutton, M. (2000). Nucl. Instrum. Methods Phys. Res. Sect. A, 451, 596-609.
7. Lynch, P. A., Stevenson, A. W., Liang, D., Parry, D., Wilkins, S. & Tamura, N. (2007). Rev. Sci. Instrum. 78, 23904-23914.
8. Yamamoto, N. (1996). Rev. Sci. Instrum. 67, 3051-3064.