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Volumn 6, Issue 19, 2010, Pages 2146-2152

High-resolution, parallel patterning of nanoparticles via an ion-induced focusing mask

Author keywords

[No Author keywords available]

Indexed keywords

ARRAY DENSITIES; FEATURE SIZES; GAS SENSORS; HIGH RESOLUTION; HIGHLY SENSITIVE; INDUCED FOCUSING; ORDERED ARRAY;

EID: 77957197667     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201000892     Document Type: Article
Times cited : (31)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.