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Volumn 507, Issue 2, 2010, Pages 531-534
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Crystallization behaviors of R2O-Al2O 3-SiO2 glass-ceramics for use as anodic bonding materials
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Author keywords
Anodic bonding; Coefficient of thermal expansion; Glass ceramics; Li2Si 2O5; Li2SiO3
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Indexed keywords
ANODIC BONDING;
COEFFICIENT OF THERMAL EXPANSION;
COEFFICIENTS OF THERMAL EXPANSIONS;
CRYSTAL PHASIS;
CRYSTALLIZATION BEHAVIOR;
CRYSTALLIZATION TEMPERATURE;
DIFFERENTIAL SCANNING CALORIMETERS;
HEAT TREATMENT SCHEDULE;
LI2SI 2O5;
LI2SIO3;
NUCLEATION AGENTS;
PARENT GLASS;
SEM;
TEST RESULTS;
ALUMINUM;
CRYSTALLIZATION;
DIFFERENTIAL SCANNING CALORIMETRY;
GLASS CERAMICS;
PRECIPITATION (CHEMICAL);
SCANNING ELECTRON MICROSCOPY;
SILICON;
SILICON COMPOUNDS;
SODIUM;
STAINLESS STEEL;
THERMAL EXPANSION;
THERMAL STRESS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
GLASS BONDING;
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EID: 77957151581
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2010.08.011 Document Type: Article |
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Times cited : (10)
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References (15)
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