Three-dimensional nano-localization of single fluorescent emitters

Optics Express

Volumn 18, Issue 19, 2010, Pages 20263-20272

  Märki, Iwan ^a   Bocchio, Noelia L ^a   Geissbuehler, Stefan ^a   Aguet, François ^a   Bilenca, Alberto ^a   Lasser, Theo ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AXIAL RANGE; FLUORESCENT EMITTERS; NANOMETER DISPLACEMENT; POLYMER BILAYERS; QUANTUM DOT; SELF-INTERFERENCES; STANDARD DEVIATION; SUPER-RESOLUTION MICROSCOPY; THREE DIMENSIONS; WATER ENVIRONMENTS;

NANOMATERIAL; QUANTUM DOT;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; FLUORESCENCE MICROSCOPY; IMAGE ENHANCEMENT; INSTRUMENTATION; NANOTECHNOLOGY; ULTRASTRUCTURE;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICROSCOPY, FLUORESCENCE; NANOSTRUCTURES; NANOTECHNOLOGY; QUANTUM DOTS;

EID: 77957014128     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.020263     Document Type: Article

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