Crystal lattice imaging of the silica and alumina faces of kaolinite using atomic force microscopy

Journal of Colloid and Interface Science

Volumn 352, Issue 1, 2010, Pages 75-80

  Gupta, Vishal ^a   Hampton, Marc A ^b   Nguyen, Anh V ^b   Miller, Jan D ^a  

^a UNIVERSITY OF UTAH   (United States)

^b UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

AFM; Alumina octahedral face; Basal plane surfaces; Crystal lattice imaging; Kaolinite; Silica tetrahedral face

Indexed keywords

AFM; ALUMINA SURFACE; AMBIENT CONDITIONS; ATOMIC SPACING; BASAL PLANES; DIFFERENT SUBSTRATES; HEXAGONAL RINGS; LATTICE RESOLUTION; OXYGEN ATOM; SURFACE LATTICE;

ATOMS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL LATTICES; KAOLINITE; MICA; OXYGEN; SILICA; SILICATE MINERALS; SURFACE STRUCTURE;

ATOMIC FORCE MICROSCOPY;

ALUMINUM OXIDE; ALUMINUM SILICATE; HYDROXYL GROUP; OXYGEN; SILICON DIOXIDE;

ARTICLE; ATOM; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; IMAGE ANALYSIS; IMAGE QUALITY; PRIORITY JOURNAL; STRUCTURE ANALYSIS;

ALUMINUM OXIDE; CRYSTALLIZATION; KAOLIN; MICROSCOPY, ATOMIC FORCE; MODELS, MOLECULAR; OXYGEN; PARTICLE SIZE; SILICON DIOXIDE; SURFACE PROPERTIES;

EID: 77956924314     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2010.08.002     Document Type: Article

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