Nanoscale infrared spectroscopy with the atomic force microscope

Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010

Volumn 1, Issue , 2010, Pages 5-8

  Prater, Craig B ^a   Cook, Debra ^a   Shetty, Roshan ^a   Kjoiler, Kevin ^a  

^a Anasys Instruments   (United States)

Author keywords

AFM; AFM IR; Infrared spectroscopy; Nanoscale IR spectroscopy; Nanothermal analysis; Photothermal induced resonance

Indexed keywords

AFM; APPLICATION EXAMPLES; ATOMIC FORCE MICROSCOPES; CHEMICAL CHARACTERIZATION; MATERIAL PROPERTY; MEASUREMENT TECHNIQUES; NANO SCALE; NANOTHERMAL ANALYSIS; PHOTO-THERMAL; POLYMER COMPOSITE; PROBE MICROSCOPY; RESEARCH GOALS; SCANNING PROBE MICROSCOPE; VIBRATIONAL RESONANCE;

ATOMIC SPECTROSCOPY; BOND STRENGTH (CHEMICAL); ELECTRIC PROPERTIES; FILMS; INFRARED SPECTROSCOPY; MECHANICAL PROPERTIES; MICROSCOPES; NANOSTRUCTURED MATERIALS; POLYMER BLENDS; PROBES; RESONANCE;

SPECTRUM ANALYSIS;

EID: 77956809599     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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