Operation of a silicon CMOS electron pump

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 2010, Pages 755-756

  Pierre, M ^a   Roche, B ^a   Jehl, X ^a   Wacquez, R ^a,b   Sanquer, M ^a   Vinet, M ^b   Feltin, N ^c   Devoille, L ^c  

^a CEA GRENOBLE   (France)

^b CEA LETI   (France)

^c LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CMOS INTEGRATED CIRCUITS; MICROELECTRONICS; SILICON;

CROSS CAPACITANCES; ELECTRON PUMP; HIGH FREQUENCY HF; MASS PRODUCTION; MEASUREMENTS OF; MICROELECTRONICS PROCESS; NON-ADIABATIC; STATE OF THE ART;

PUMPS;

EID: 77956636228     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CPEM.2010.5543479     Document Type: Conference Paper

References (9)

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