SCOPUS 정보 검색 플랫폼

Volumn 92, Issue 4, 2008, Pages

Nanoampere charge pump by single-electron ratchet using silicon nanowire metal-oxide-semiconductor field-effect transistor

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSITIONS; MOSFET DEVICES; NANOTECHNOLOGY; NANOWIRES; SEMICONDUCTING SILICON;

NONADIABATIC ELECTRON CAPTURE; SINGLE-ELECTRON RATCHET;

CHARGE TRANSFER;

EID: 38849153084 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2837544 Document Type: Article

Times cited : (201)

References (9)

1
- 0000764282
- APPLAB 0003-6951 10.1063/1.117492.
- M. W. Keller, J. M. Martinis, N. M. Zimmerman, and A. H. Steinbach, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.117492 69, 1804 (1996).
- (1996) Appl. Phys. Lett. , vol.69 , pp. 1804
- Keller, M.W.¹ Martinis, J.M.² Zimmerman, N.M.³ Steinbach, A.H.⁴

2
- 33646521558
- APPLAB 0003-6951 10.1063/1.2200475.
- K. Nishiguchi, A. Fujiwara, Y. Ono, H. Inokawa, and Y. Takahashi, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2200475 88, 183101 (2006).
- (2006) Appl. Phys. Lett. , vol.88 , pp. 183101
- Nishiguchi, K.¹ Fujiwara, A.² Ono, Y.³ Inokawa, H.⁴ Takahashi, Y.⁵

3
- 44949283527
- PHYBE3 0921-4526 10.1016/0921-4526(91)90332-9.
- H. Pothier, P. Lafarge, R. F. Orfila, C. Urbina, D. Esteve, and M. H. Devoret, Physica B PHYBE3 0921-4526 10.1016/0921-4526(91)90332-9 169, 573 (1991).
- (1991) Physica B , vol.169 , pp. 573
- Pothier, H.¹ Lafarge, P.² Orfila, R.F.³ Urbina, C.⁴ Esteve, D.⁵ Devoret, M.H.⁶

4
- 0347687535
- PRLTAO 0031-9007 10.1103/PhysRevLett.64.2691.
- L. J. Geerligs, V. J. Anderegg, P. A. M. Holweg, J. E. Mooji, H. Pothier, D. Esteve, C. Urbina, and M. H. Devoret, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.64.2691 64, 2691 (1990).
- (1990) Phys. Rev. Lett. , vol.64 , pp. 2691
- Geerligs, L.J.¹ Anderegg, V.J.² Holweg, P.A.M.³ Mooji, J.E.⁴ Pothier, H.⁵ Esteve, D.⁶ Urbina, C.⁷ Devoret, M.H.⁸

5
- 12044254174
- PRLTAO 0031-9007 10.1103/PhysRevLett.67.1626.
- L. P. Kouwenhoven, A. T. Johnson, N. C. van der Vaart, and C. J. P. M. Harmans, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.67.1626 67, 1626 (1991).
- (1991) Phys. Rev. Lett. , vol.67 , pp. 1626
- Kouwenhoven, L.P.¹ Johnson, A.T.² Van Der Vaart, N.C.³ Harmans, C.J.P.M.⁴

6
- 1642321064
- APPLAB 0003-6951 10.1063/1.1650036.
- A. Fujiwara, N. M. Zimmerman, Y. Ono, and Y. Takahashi, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1650036 84, 1323 (2004).
- (2004) Appl. Phys. Lett. , vol.84 , pp. 1323
- Fujiwara, A.¹ Zimmerman, N.M.² Ono, Y.³ Takahashi, Y.⁴

7
- 34247853196
- ZZZZZZ 1745-2473.
- M. D. Blumenthal, B. Kaestner, L. Li, S. Giblin, T. J. B. M. Janssen, M. Pepper, D. Anderson, G. Jones, and D. A. Ritchie, Nat. Phys. ZZZZZZ 1745-2473 3, 343 (2007).
- (2007) Nat. Phys. , vol.3 , pp. 343
- Blumenthal, M.D.¹ Kaestner, B.² Li, L.³ Giblin, S.⁴ Janssen, T.J.B.M.⁵ Pepper, M.⁶ Anderson, D.⁷ Jones, G.⁸ Ritchie, D.A.⁹

8
- 0037899506
- IEIMAO 0018-9456 10.1109/TIM.2003.811578.
- R. E. Elmquist, N. M. Zimmerman, and W. H. Huber, IEEE Trans. Instrum. Meas. IEIMAO 0018-9456 10.1109/TIM.2003.811578 52, 590 (2003).
- (2003) IEEE Trans. Instrum. Meas. , vol.52 , pp. 590
- Elmquist, R.E.¹ Zimmerman, N.M.² Huber, W.H.³

9
- 0036179557
- PRPLCM 0370-1573 10.1016/S0370-1573(01)00081-3.
- P. Reimann, Phys. Rep. PRPLCM 0370-1573 10.1016/S0370-1573(01)00081-3 361, 57 (2002).
- (2002) Phys. Rep. , vol.361 , pp. 57
- Reimann, P.¹

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