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Japanese Journal of Applied Physics

Volumn 49, Issue 7 PART 2, 2010, Pages

Measurement of elastic constant and refraction index of thin films at low temperatures using picosecond ultrasound

(5) Tanigaki, Kenichi a Kusumoto, Tatsuya a Ogi, Hirotsugu a Nakamura, Nobutomo a Hirao, Masahiko a

a OSAKA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC PULSE; BRILLOUIN OSCILLATIONS; CRYOGENIC TEMPERATURES; FEMTOSECOND LIGHT PULSE; LONGITUDINAL WAVES; LOW TEMPERATURES; METALLIC THIN FILMS; OPTICAL PROPERTIES OF THIN FILMS; OUT-OF-PLANE; PICOSECONDS; PROBE LIGHT; PT THIN FILMS; PULSE ECHOES; REFRACTION INDEX; TRANSPARENT MATERIAL; ULTRA-HIGH-FREQUENCY; ULTRASOUND MEASUREMENT;

ELASTIC CONSTANTS; LIGHT REFRACTION; PLATINUM; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING SILICON COMPOUNDS; STIFFNESS; THERMOELECTRICITY; THIN FILMS; ULTRASONICS; VAPOR DEPOSITION;

OPTICAL FILMS;

EID: 77956590200 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.49.07HB01 Document Type: Article

Times cited : (10)

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