Circuit modeling methodology for isolated, high bandwidth junction temperature estimation

2010 International Power Electronics Conference - ECCE Asia -, IPEC 2010

Volumn , Issue , 2010, Pages 970-974

  Walters, Marsha L ^a   Lorenz, Robert D ^a  

^a University of Wisconsin Madison ^*  (United States)

Author keywords

EMI; Modeling; Reliability

Indexed keywords

ACTIVE THERMAL CONTROL; BOOST CONVERTER; CIRCUIT MODELING; CIRCUIT MODELS; CIRCUIT PROPERTIES; EMI; HIGH BANDWIDTH; JUNCTION TEMPERATURES; MODELING; MODELING RESULTS; MODELING TECHNIQUE; MOSFETS; PARASITIC EFFECT; PASSIVE COMPONENTS; WAVE FORMS;

BANDWIDTH; CIRCUIT THEORY; RELIABILITY; TEMPERATURE MEASUREMENT;

POWER ELECTRONICS;

EID: 77956499990     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPEC.2010.5542176     Document Type: Conference Paper

References (20)

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