New intelligent power multi-chips modules with junction temperature detecting function

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1998, Pages 281-284

  Kajiwara, Tamao ^a   Yamaguchi, Atsushi ^a   Hoshi, Yasuyuki ^a   Sakurai, Kenya ^a  

^a FUJI ELECTRIC CO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; GATES (TRANSISTOR); MICROPROCESSOR CHIPS; POWER ELECTRONICS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR JUNCTIONS;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT); INTELLIGENT POWER MULTI-CHIP MODULES (IPMCM);

MULTICHIP MODULES;

EID: 0031622340     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)