Fast and accurate recognition of control chart patterns using a time delay neural network

Journal of the Chinese Institute of Industrial Engineers

Volumn 27, Issue 1, 2010, Pages 61-79

  Guh, Ruey Shiang ^a   Shiue, Yeou Ren ^b  

^a NATIONAL FORMOSA UNIVERSITY   (Taiwan)

^b HUAFAN UNIVERSITY   (Taiwan)

Author keywords

control chart; pattern recognition; statistical process control; time delay neural network

Indexed keywords

AVERAGE RUN LENGTHS; BACKPROPAGATION NETWORK; CONTROL CHART PATTERN; CONTROL CHARTS; CRITICAL ISSUES; DYNAMIC PATTERNS; MANUFACTURING PROCESS; MISCLASSIFICATIONS; NOVEL APPLICATIONS; NUMERICAL RESULTS; RECOGNITION ACCURACY; STATISTICAL PROCESS; TIME DELAY NEURAL NETWORK; TIME DELAY NEURAL NETWORKS; TIME SEQUENCES;

DELAY CONTROL SYSTEMS; FLOWCHARTING; NEURAL NETWORKS; NUMERICAL ANALYSIS; PATTERN RECOGNITION; QUALITY CONTROL; TIME DELAY;

STATISTICAL PROCESS CONTROL;

EID: 77956495284     PISSN: 10170669     EISSN: 21517606     Source Type: Journal    
DOI: 10.1080/10170660903529596     Document Type: Article

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