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Lecture Notes in Control and Information Sciences
Volumn 345, Issue , 2006, Pages 112-119
Abnormal pattern parameters estimation of control chart based on wavelet transform and probabilistic neural network
Author keywords

[No Author keywords available]
Indexed keywords

EID: 33748865351     PISSN: 01708643     EISSN: None     Source Type: Book Series    
DOI: 10.1007/11816515_12     Document Type: Conference Paper
Times cited : (4)
References (4)
  • 1
    • 0036552318 scopus 로고    scopus 로고
    • A neural network approach for abnormal pattern parameters estimation of control charts
    • Le, Q. H.: A Neural Network Approach for Abnormal Pattern Parameters Estimation of Control Charts. Aeronautical Manufacturing Technology, 4 (2002) 31-33
    • (2002) Aeronautical Manufacturing Technology , vol.4 , pp. 31-33
    • Le, Q.H.1
  • 2
    • 0037288350 scopus 로고    scopus 로고
    • Integrating artificial intelligence into on-line statistical process control
    • Ruey-Shiang, Guh.: Integrating Artificial Intelligence into On-line Statistical Process Control. Quality and Reliability Engineering International. 19 (2003) 1-20
    • (2003) Quality and Reliability Engineering International , vol.19 , pp. 1-20
    • Ruey-Shiang, Guh.1
  • 3
    • 23144467659 scopus 로고    scopus 로고
    • A hybrid learning-based model for on-line detection and analysis of control chart patterns
    • Ruey-shiang, Guh.: A hybrid Learning-based Model for On-line Detection and Analysis of Control Chart Patterns. Computers & Industrial Engineering, 49 (2005) 35-62
    • (2005) Computers & Industrial Engineering , vol.49 , pp. 35-62
    • Ruey-Shiang, Guh.1
  • 4
    • 0031192543 scopus 로고    scopus 로고
    • Feature-based control chart pattern recognition
    • Pham, D. T, Waini, M. A.: Feature-based Control Chart Pattern Recognition. INT. J. PROD. RES., 35 (7) (1997) 1875-1890
    • (1997) Int. J. Prod. Res. , vol.35 , Issue.7 , pp. 1875-1890
    • Pham, D.T.1    Waini, M.A.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.