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Journal of Electroceramics

Volumn 24, Issue 3, 2010, Pages 231-236

Influence of the processing rates and sintering temperatures on the dielectric properties of CaCu3Ti4O12 ceramics

(2) Kwon, Seunghwa a Cann, David P a

a Oregon State University (United States)

Author keywords

Cation stoichiometry; Ceramic processing; Defects; Dielectric properties

Indexed keywords

CATION STOICHIOMETRY; CERAMIC PROCESSING; DEFECT CHEMISTRY; DIELECTRIC CONSTANTS; GRAIN CONDUCTIVITY; IMPEDANCE MEASUREMENT; LOSS TANGENT; NON-STOICHIOMETRY; PROCESSING CONDITION; PROCESSING RATES; SECONDARY PHASIS; SINTERING TEMPERATURES; SOLID-STATE SYNTHESIS; X-RAY DIFFRACTION DATA;

CERAMIC MATERIALS; DEFECTS; HEATING; HEATING RATE; PERMITTIVITY; POSITIVE IONS; STOICHIOMETRY; X RAY DIFFRACTION;

SINTERING;

EID: 77956471194 PISSN: 13853449 EISSN: 15738663 Source Type: Journal
DOI: 10.1007/s10832-009-9563-1 Document Type: Article

Times cited : (23)

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