Ultrasensitive detection of force and displacement using trapped ions

Nature Nanotechnology

Volumn 5, Issue 9, 2010, Pages 646-650

  Biercuk, Michael J ^a,b   Uys, Hermann ^a,c   Britton, Joe W ^a   Vandevender, Aaron P ^a   Bollinger, John J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF SYDNEY   (Australia)

^c DSI CSIR Nanotechnology Innovation Centre   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

IONS; NANOTECHNOLOGY; OSCILLISTORS;

DOPPLER VELOCIMETRY; FORCE AND DISPLACEMENTS; NANO-SCALE MECHANICAL OSCILLATORS; NANOMECHANICAL RESONATORS; NANOSCALE DISPLACEMENT; PHYSICAL PHENOMENA; THREE ORDERS OF MAGNITUDE; ULTRASENSITIVE DETECTION;

TRAPPED IONS;

ARTICLE; CRYSTAL; FORCE; ION DISPLACEMENT; ION TRAP MASS SPECTROMETRY; LASER DOPPLER FLOWMETRY; MOLECULAR MECHANICS; MOTION; NANOANALYSIS; NANOFABRICATION; OSCILLATOR; PRIORITY JOURNAL; SENSITIVITY AND SPECIFICITY;

EID: 77956439234     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2010.165     Document Type: Article

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