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Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 28, Issue 5, 2010, Pages 1255-1258

Preparation and topography analysis of randomly textured glass substrates

(3) Bunte, Eerke a Zhang, Wendi a Hüpkes, Jürgen a

a FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ETCH MASK; ETCHING TIME; FLAT GLASS; GLASS SHEET; GLASS SUBSTRATES; GLASS SURFACES; ION BEAM ETCHING; LATERAL CORRELATION LENGTH; LIGHT-TRAPPING; NOVEL METHODS; ROOT MEAN SQUARE ROUGHNESS; SILICON-BASED; SURFACE FEATURE; TEXTURED ZINC OXIDE; THIN-FILM SOLAR CELLS; TRANSPARENT CONDUCTIVE LAYER; ZNO; ZNO FILMS;

ETCHING; GLASS; METALLIC FILMS; MICROCRYSTALLINE SILICON; SOLAR CELLS; SUBSTRATES; SURFACE TOPOGRAPHY; TEXTURES; ZINC; ZINC OXIDE;

TOPOGRAPHY;

EID: 77956417900 PISSN: 07342101 EISSN: None Source Type: Journal
DOI: 10.1116/1.3480338 Document Type: Article

Times cited : (9)

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