Negative real parts of the equivalent permittivity, permeability, and refractive index of sculptured-nanorod arrays of silver

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 28, Issue 5, 2010, Pages 1078-1083

  Jen, Yi Jun ^a   Lakhtakia, Akhlesh ^b   Yu, Ching Wei ^a   Wang, Yu Hsiung ^a  

^a NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^b The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

A-PLANE; CONSTITUTIVE PARAMETERS; ILLUMINATION CONDITIONS; LARGE-SCALE PRODUCTION; LINEAR-POLARIZATION; NANOROD ARRAYS; POLARIZATION INTERFEROMETRY; POLARIZATION STATE; REAL PART; REFLECTION AND TRANSMISSION COEFFICIENTS; SILVER THIN FILMS; THREE-WAVELENGTHS; VAPOR FLUXES; WALK-OFF;

INTERFEROMETRY; LIGHT REFRACTION; NANORODS; ORGANIC POLYMERS; PERMITTIVITY; POLARIZATION; REFRACTIVE INDEX; REFRACTOMETERS; THIN FILMS; VAPOR DEPOSITION; VAPORS;

SILVER;

EID: 77956409387     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3456125     Document Type: Article

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