메뉴 건너뛰기




Volumn , Issue , 2009, Pages 637-642

Prest: An intelligent software metrics extraction, analysis and defect prediction tool

Author keywords

[No Author keywords available]

Indexed keywords

CALL GRAPHS; DEFECT PREDICTION; EFFICIENCY INCREASE; INDUSTRY PROJECT; INTELLIGENT PREDICTORS; INTELLIGENT SOFTWARE; OPEN SOURCE TOOLS; OPEN SOURCES; PREDICTION AND ANALYSIS; PREDICTION PROCESS; PROGRAMMING LANGUAGE; SOURCE CODES; TESTING EFFICIENCY; TESTING EFFORT;

EID: 77956406137     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (29)

References (28)
  • 2
    • 0028393055 scopus 로고
    • Software measurement: A necessary scientific basis
    • Mar
    • N. Fenton. Software measurement: a necessary scientific basis. Software Engineering, IEEE Transactions on, 20(3):199-206, Mar 1994.
    • (1994) Software Engineering, IEEE Transactions on , vol.20 , Issue.3 , pp. 199-206
    • Fenton, N.1
  • 4
    • 33244495065 scopus 로고    scopus 로고
    • Static analysis tools as early indicators of pre-release defect density. Software Engineering, 2005
    • May
    • N. Nagappan and T. Ball. Static analysis tools as early indicators of pre-release defect density. Software Engineering, 2005. ICSE 2005. Proceedings. 27th nternational Conference on, pages 580-586, May 2005.
    • (2005) ICSE 2005. Proceedings. 27th Nternational Conference on , pp. 580-586
    • Nagappan, N.1    Ball, T.2
  • 8
    • 84943179973 scopus 로고    scopus 로고
    • A survey on the fitness of commercial software metric tools for service in heterogeneous environments: Common pitfalls
    • M. Auer, B. Graser, and S. Biffl. A survey on the fitness of commercial software metric tools for service in heterogeneous environments: common pitfalls. Software Metrics Symposium, 2003.
    • Software Metrics Symposium, 2003
    • Auer, M.1    Graser, B.2    Biffl, S.3
  • 10
    • 0003957032 scopus 로고    scopus 로고
    • Data Mining: Practical Machine Learning Tools and Techniques
    • Morgan Kaufmann, second edition, June
    • I. H. Witten and E. Frank. Data Mining: Practical Machine Learning Tools and Techniques. Morgan Kaufmann Series in Data Management Systems. Morgan Kaufmann, second edition, June 2005.
    • (2005) Morgan Kaufmann Series in Data Management Systems
    • Witten, I.H.1    Frank, E.2
  • 14
    • 78149307033 scopus 로고    scopus 로고
    • available at
    • Software Research Laboratory (Softlab), available at www.softlab.boun. edu.tr
  • 17
    • 33845782503 scopus 로고    scopus 로고
    • Data Mining Static Code Attributes to Learn Defect Predictors
    • January
    • T. Menzies, J. Greenwald and A. Frank. Data Mining Static Code Attributes to Learn Defect Predictors, IEEE Transactions on Software Engineering, January 2007, Vol.33, No. 1, pp. 2-13.
    • (2007) IEEE Transactions on Software Engineering , vol.33 , Issue.1 , pp. 2-13
    • Menzies, T.1    Greenwald, J.2    Frank, A.3
  • 19
    • 78149301887 scopus 로고    scopus 로고
    • available at sourceforge.net/projects/cccc
    • C and C++ Code Counter, available at sourceforge.net/projects/cccc, 2006.
    • (2006) C and C++ Code Counter
  • 21
    • 84886698657 scopus 로고    scopus 로고
    • available at depfind.sourceforge.net
    • Dependency Finder, available at depfind.sourceforge.net, 2008.
    • (2008) Dependency Finder
  • 24
    • 0001622174 scopus 로고    scopus 로고
    • A Validation of Object-Oriented Design Metrics as Quality Indicators
    • October
    • Victor R. Basili , Lionel C. Briand , Walcélio L. Melo, A Validation of Object-Oriented Design Metrics as Quality Indicators, IEEE Transactions on Software Engineering, v.22 n.10, p.751-761, October 1996
    • (1996) IEEE Transactions on Software Engineering , vol.22 , Issue.10 , pp. 751-761
    • Basili, V.R.1    Briand, L.C.2    Melo, W.L.3
  • 28
    • 28244461468 scopus 로고    scopus 로고
    • Building Defect Prediction Models in Practice
    • November
    • A. Gunes Koru , Hongfang Liu, Building Defect Prediction Models in Practice, IEEE Software, v.22 n.6, p.23-29, November 2005
    • (2005) IEEE Software , vol.22 , Issue.6 , pp. 23-29
    • Gunes Koru, A.1    Liu, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.