Static analysis tools as early indicators of pre-release defect density

Proceedings - 27th International Conference on Software Engineering, ICSE05

Volumn , Issue , 2005, Pages 580-586

  Nagappan, Nachiappan ^a   Ball, Thomas ^b  

^a North Carolina State University   (United States)

^b MICROSOFT RESEARCH   (United States)

Author keywords

Defect density; Fault proneness; Static analysis tools; Statistical methods

Indexed keywords

DEFECT DENSITY; FAULT-PRONENESS; STATIC ANALYSIS TOOLS; DISCRIMINANT ANALYSIS; FAULT PRONENESS;

AUTOMATIC TESTING; COMPUTER OPERATING SYSTEMS; COMPUTER SOFTWARE; SERVERS; STATISTICAL METHODS; CODES (SYMBOLS); COMPUTER HARDWARE; COMPUTER SOFTWARE SELECTION AND EVALUATION;

SOFTWARE ENGINEERING;

EID: 33244495065     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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