Ensemble of software defect predictors: A case study

ESEM'08: Proceedings of the 2008 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement

Volumn , Issue , 2008, Pages 318-320

  Tosun, Ayse ^a   Turhan, Burak ^a   Bener, Ayse ^a  

^a BOGAZICI UNIVERSITY   (Turkey)

Author keywords

Defect prediction; Ensemble of classifiers; Static code attributes

Indexed keywords

CLASSIFIERS; COST BENEFIT ANALYSIS; LEARNING SYSTEMS; SOFTWARE ENGINEERING;

DATA-SETS; DEFECT DETECTIONS; DEFECT PREDICTION; DEFECT PREDICTION MODELS; ENSEMBLE OF CLASSIFIERS; NAIVE-BAYES ALGORITHMS; SOFTWARE DEFECTS; STATIC CODE ATTRIBUTES;

DEFECTS;

EID: 62949247536     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1414004.1414066     Document Type: Conference Paper

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