CCD polarization imaging sensor with aluminum nanowire optical filters

Optics Express

Volumn 18, Issue 18, 2010, Pages 19087-19094

  Gruev, Viktor ^a   Perkins, Rob ^a   York, Timothy ^a  

^a WASHINGTON UNIVERSITY IN ST LOUIS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; LIGHT POLARIZATION; MATCHED FILTERS; MONOLITHIC INTEGRATED CIRCUITS; NANOWIRES; OPTICAL FILTERS; OPTICAL RECORDING; PIXELS; POLARIZATION; SENSORS; SIGNAL TO NOISE RATIO;

CCD IMAGING; DEGREE OF LINEAR POLARIZATION; FRAMES PER SECONDS; IMAGING ELEMENTS; IMAGING SENSORS; PARTIALLY POLARIZED LIGHT; PIXEL PITCH; POLARIZATION IMAGING; POWER CONSUMPTION; VISIBLE SPECTRA;

OPTICAL PROPERTIES;

ALUMINUM; METAL NANOPARTICLE;

ARTICLE; CHEMISTRY; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; OPTICS; PHOTOGRAPHY; POLARIZATION MICROSCOPY; SCANNING ELECTRON MICROSCOPY; STATISTICAL MODEL; VIDEORECORDING;

ALUMINUM; EQUIPMENT DESIGN; METAL NANOPARTICLES; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, POLARIZATION; MODELS, STATISTICAL; NANOTECHNOLOGY; OPTICS AND PHOTONICS; PHOTOGRAPHY; VIDEO RECORDING;

EID: 77956390973     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.019087     Document Type: Article

References (18)

1. E. R. Fossum, "CMOS image sensors: electronic camera-on-a-chip, " IEEE Trans. Electron. Dev. 44(10), 1689-1698 (1997).
2. D. Goldstein, "Polarized Light," (Marcel Dekker: New York, NY, 2003).
3. J. S. Tyo, D. L. Goldstein, D. B. Chenault, and J. A. Shaw, "Review of passive imaging polarimetry for remote sensing applications," Appl. Opt. 45(22), 5453-5469 (2006).
4. S. Shwartz, E. Namer, and Y. Schechner, "Blind Haze Seperation," Proc. IEEE Comp. Vision and Pat. Recog. 2, 1984-1991 (2006).
5. T. Treibitz, and Y. Y. Schechner, "Active polarization descattering," IEEE Trans. Pattern Anal. Mach. Intell. 31(3), 385-399 (2009).
6. W. Plucknett, and R. Dowd, "Refraction and Polarization Properties of Binary Solutions of the Nitrotoluene Isomers with the Xylene Isomers, Chloroform and Cyclohexane," J. Chem. Eng. Data 8(2), 207-210 (1963).
7. J. L. Deuzé, F. M. Bréon, C. Devaux, P. Goloub, M. Herman, B. Lafrance, F. Maignan, A. Marchand, F. Nadal, G. Perry, and D. Tanré, "Remote sensing of aerosols over land surfaces from POLDER-ADEOS-1 polarized measurements," J. Geophys. Res. 106(D5), 4913-4926 (2001).
8. E. Puttonen, J. Suomalainen, T. Hakala, and J. Peltoniemi, "Measurement of Reflectance Properties of Asphalt Surfaces and Their Usability as Reference Targets for Aerial Photos," IEEE Trans. Geosci. Rem. Sens. 47(7), 2330-2339 (2009).
9. S. S. Lin, K. M. Yemelyanov, E. N. Pugh, Jr., and N. Engheta, "Polarization-based and specular-reflection-based noncontact latent fingerprint imaging and lifting," J. Opt. Soc. Am. A 23(9), 2137-2153 (2006).
10. E. Salomatina-Motts, V. A. Neel, and A. N. Yaroslavskaya, "Multimodal polarization system for imaging skin cancer," Opt. Spectrosc. 107(6), 884-890 (2009).
11. B. I. Gramatikov, O. H. Zalloum, Y. K. Wu, D. G. Hunter, and D. L. Guyton, "Directional eye fixation sensor using birefringence-based foveal detection," Appl. Opt. 46(10), 1809-1818 (2007).
12. A. Andreou, and Z. Kalayjian, "Polarization imaging: principles and integrated polarimeters," IEEE Sens. J. 2(6), 566-576 (2002).
13. M. Momeni, and A. H. Titus, "An analog VLSI chip emulating polarization vision of Octopus retina," IEEE Trans. Neural Netw. 17(1), 222-232 (2006).
14. T. Tokuda, S. Sato, H. Yamada, K. Sasagawa, and J. Ohta, "Polarisation-analysing CMOS photosensor with monolithically embedded wire grid polarizer," Electron. Lett. 45(4), 228-230 (2009).
15. X. Zhao, F. Boussaid, A. Bermak, and V. G. Chigrinov, "Thin Photo-Patterned Micropolarizer Array for CMOS Image Sensors," IEEE Photon. Technol. Lett. 21(12), 805-807 (2009).
16. V. Gruev, A. Ortu, N. Lazarus, J. Van der Spiegel, and N. Engheta, "Fabrication of a dual-tier thin film micropolarization array," Opt. Express 15(8), 4994-5007 (2007).
17. J. Wang, F. Walters, X. Liu, P. Sciortino, and X. Deng, "High-performance, large area, deep ultraviolet to infrared polarizers based on 40 nm line/78 nm space nanowire grids," Appl. Phys. Lett. 90(6), 061104 (2007).
18. M. Sheik-Bahae, A. A. Said, and E. W. Van Stryland, "High- sensitivity, single-beam n(2) measurements," Opt. Lett. 14(17), 955-957 (1989).