Microstructure and relaxor behavior of dense fine-grain FeTiTaO6 ceramics

Journal of the American Ceramic Society

Volumn 93, Issue 9, 2010, Pages 2491-2494

  Shi, Yun ^a   Hou, Yu Dong ^a   Wang, Chao ^a   Ge, Hai Yan ^a   Zhu, Man Kang ^a  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PERMITTIVITIES; HETEROVALENT SUBSTITUTION; HIGH DENSITY; HIGHER TEMPERATURES; LEAD-FREE RELAXOR; MEAN PARTICLE SIZE; RELAXOR BEHAVIOR; RUTILE STRUCTURE; SOLID STATE METHOD; STRONG DISPERSION; VOGEL-FULCHER;

CERAMIC MATERIALS; OXIDE MINERALS; SCANNING ELECTRON MICROSCOPY; TANTALUM; X RAY DIFFRACTION;

FERROELECTRIC MATERIALS;

EID: 77956371951     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2010.03829.x     Document Type: Article

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