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Volumn 2, Issue 9, 2010, Pages 1708-1714
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Growth of horizontally aligned single-walled carbon nanotubes on anisotropically etched silicon substrate
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Author keywords
[No Author keywords available]
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Indexed keywords
ALIGNED GROWTH;
ALIGNED NANOTUBES;
ALIGNED SINGLE-WALLED CARBON NANOTUBES;
DEGREE OF ALIGNMENTS;
DIRECT INTEGRATION;
GAS FLOWS;
NANOELECTRONIC APPLICATIONS;
NANOTUBE ALIGNMENT;
SI SUBSTRATES;
SI(1 0 0);
SILICON SUBSTRATES;
TEMPLATED;
THERMAL OXIDATION;
ALIGNMENT;
CARBON NANOTUBES;
NANOELECTRONICS;
SILICON;
SILICON COMPOUNDS;
SILICON OXIDES;
SINGLE-WALLED CARBON NANOTUBES (SWCN);
CARBON NANOTUBE;
SILICON;
SILICON DIOXIDE;
ARTICLE;
CHEMISTRY;
ELECTRONICS;
OXIDATION REDUCTION REACTION;
TEMPERATURE;
ULTRASTRUCTURE;
ELECTRONICS;
NANOTUBES, CARBON;
OXIDATION-REDUCTION;
SILICON;
SILICON DIOXIDE;
TEMPERATURE;
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EID: 77956366036
PISSN: 20403364
EISSN: 20403372
Source Type: Journal
DOI: 10.1039/c0nr00170h Document Type: Article |
Times cited : (17)
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References (29)
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