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Volumn 18, Issue 18, 2010, Pages 18945-18959

Numerical analysis of deep sub-wavelength integrated plasmonic devices based on semiconductor-insulator-metal strip waveguides

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LOSSES; FINITE ELEMENT METHOD; PLASMONS; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTOR INSULATOR BOUNDARIES; STRIP METAL; WAVEGUIDES;

EID: 77956363009     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.018945     Document Type: Article
Times cited : (109)

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