Applied physics: Plasmonics applied

Science

Volumn 322, Issue 5903, 2008, Pages 868-869

  Polman, Albert ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

METAL; NANOPARTICLE;

APPLIED SCIENCE; ELECTRON; LIGHT EFFECT; PHYSICS;

ELECTRON; NANOANALYSIS; OPTICS; PRIORITY JOURNAL; REVIEW; SEMICONDUCTOR; SURFACE PLASMON RESONANCE;

EID: 55849117370     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1163959     Document Type: Review

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