Underlayer dependence of microtexture, microstructure and magnetic properties of c-axis oriented strontium ferrite thin films

Thin Solid Films

Volumn 518, Issue 23, 2010, Pages 7059-7063

  Kaewrawang, Arkom ^a   Ghasemi, Ali ^a   Liu, Xiaoxi ^a   Morisako, Akimitsu ^a  

^a SHINSHU UNIVERSITY   (Japan)

Author keywords

Magnetic properties and measurements; Magnetic structure; Magnetism

Indexed keywords

COERCIVITIES; CRYSTALLIZATION TEMPERATURE; DC MAGNETRON SPUTTERING SYSTEMS; MAGNETIC PROPERTIES AND MEASUREMENT; MICRO-TEXTURE; PT UNDERLAYERS; SI SUBSTRATES; STRONTIUM FERRITES; THERMALLY OXIDIZED SILICON; UNDERLAYERS; UNIAXIAL ANISOTROPY;

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; FERRITE; GOLD; MAGNETIC DEVICES; MAGNETIC PROPERTIES; MAGNETIC STRUCTURE; PLATINUM; SATURATION MAGNETIZATION; SEMICONDUCTING SILICON COMPOUNDS; SILICON OXIDES; SILICON WAFERS; STRONTIUM; THIN FILMS; VAPOR DEPOSITION;

MAGNETISM;

EID: 77956225215     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.07.032     Document Type: Article

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