Perpendicular orientation of Ba-ferrite thin film with Al top layer and underlayer

IEEE Transactions on Magnetics

Volumn 41, Issue 11, 2005, Pages 4362-4364

  Shams, Nazmun N ^b   Liu, Xiaoxi ^a,b   Matsumoto, Mitsunori ^a,b   Morisako, Akimitsu ^a,b  

^a IEEE

^b SHINSHU UNIVERSITY   (Japan)

Author keywords

Al; Ba ferrite; Hexagonal ferrite; Perpendicular recording; Si substrate; Thin film media

Indexed keywords

ALUMINUM; ANNEALING; BARIUM; CRYSTALLIZATION; NANOSTRUCTURED MATERIALS; X RAY DIFFRACTION ANALYSIS;

BA-FERRITE; HEXAGONAL FERRITE; SI SUBSTRATES;

MAGNETIC THIN FILMS;

EID: 28644444030     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2005.854697     Document Type: Article

References (6)

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