Properties of Sr ferrite thin films on Al-Si underlayer

IEEE Transactions on Magnetics

Volumn 45, Issue 6, 2009, Pages 2587-2589

  Kaewrawang, Arkom ^a   Ghasemi, Ali ^a   Liu, Xiaoxi ^a   Morisako, Akimitsu ^a  

^a SHINSHU UNIVERSITY   (Japan)

Author keywords

Al Si; Magnetron sputtering; Perpendicular magnetic recording; Strontium ferrite

Indexed keywords

ALUMINUM COMPOUNDS; COERCIVE FORCE; FERRITE; MAGNETRON SPUTTERING; SATURATION MAGNETIZATION; SILICON COMPOUNDS; SILICON WAFERS; STRONTIUM; SUBSTRATES;

MAGNETRON SPUTTERING SYSTEMS; PERPENDICULAR MAGNETIC RECORDING; REMANENT SQUARENESS; SR FERRITE; STRONTIUM FERRITES; SUBSTRATE TEMPERATURE; UNDERLAYERS;

THIN FILMS;

EID: 66549097708     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2009.2018900     Document Type: Article

References (11)

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