Enhanced visual analysis for cluster tendency assessment and data partitioning

IEEE Transactions on Knowledge and Data Engineering

Volumn 22, Issue 10, 2010, Pages 1401-1414

  Wang, Liang ^a   Geng, Xin ^c,d   Bezdek, James ^b   Leckie, Christopher ^b   Kotagiri, Ramamohanarao ^b  

^a INSTITUTE OF AUTOMATION   (China)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c SOUTHEAST UNIVERSITY   (China)

^d MONASH UNIVERSITY   (Australia)

Author keywords

cluster tendency; Clustering; out of sample extension.; spectral embedding; VAT

Indexed keywords

CLUSTER TENDENCY; CLUSTERING; OUT-OF-SAMPLE EXTENSION; SPECTRAL EMBEDDING; VAT;

CLUSTER ANALYSIS;

CLUSTERING ALGORITHMS;

EID: 77956025853     PISSN: 10414347     EISSN: None     Source Type: Journal    
DOI: 10.1109/TKDE.2009.192     Document Type: Article

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