Study of dynamic processes on semiconductor surfaces using time-resolved scanning tunneling microscopy

Journal of Physics Condensed Matter

Volumn 22, Issue 26, 2010, Pages

  Saedi, Amirmehdi ^a   Poelsema, Bene ^a   Zandvliet, Harold J W ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC PROCESS; FEED-BACK LOOP; ORDERS OF MAGNITUDE; SCANNING TUNNELING MICROSCOPES; SEMI-CONDUCTOR SURFACES; SPATIAL INFORMATIONS; STM IMAGES; SURFACE DYNAMICS; TIME RESOLUTION; TIME TRACE;

GERMANIUM; PLATINUM; SCANNING TUNNELING MICROSCOPY;

SCANNING;

GERMANIUM; PLATINUM;

ARTICLE; CHEMISTRY; COMPUTER SIMULATION; INSTRUMENTATION; KINETICS; METHODOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; SURFACE PROPERTY; TIME;

COMPUTER SIMULATION; GERMANIUM; KINETICS; MICROSCOPY, SCANNING TUNNELING; PLATINUM; SEMICONDUCTORS; SURFACE PROPERTIES; TIME FACTORS;

EID: 77955979582     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/26/264007     Document Type: Article

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