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Volumn 181, Issue 17-18, 2010, Pages 796-811

Structural and electrical properties of Bi3Nb 1 - XErxO7 - X

Author keywords

Bismuth oxide; Defect structure; Fluorite; Impedance spectroscopy; Neutron diffraction

Indexed keywords

A.C. IMPEDANCE SPECTROSCOPY; BISMUTH OXIDES; COMPOSITIONAL CHANGES; DOPANT CATION; DOUBLE SUBSTITUTION; FLUORITE; FLUORITE STRUCTURE; IMPEDANCE SPECTROSCOPY; LATTICE PARAMETERS; LOCAL ORDERING; NONLINEAR BEHAVIOURS; OCTAHEDRAL COORDINATION GEOMETRY; OXIDE IONS; SHORT RANGE ORDERING; STRUCTURAL AND ELECTRICAL PROPERTIES; SUPERLATTICE ORDERING; THERMAL CHANGES; X-RAY AND NEUTRON DIFFRACTION;

EID: 77955919804     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2010.04.012     Document Type: Article
Times cited : (25)

References (33)
  • 32
    • 77955926230 scopus 로고    scopus 로고
    • PhD Thesis, Queen Mary University of London
    • X. Liu, PhD Thesis, Queen Mary University of London, 2009.
    • (2009)
    • Liu, X.1
  • 33
    • 0002450907 scopus 로고
    • The Rietveld Method
    • R.A. Young, Oxford University Press New York
    • R.A. Young, The Rietveld Method IUCR Monographs on Crystallography vol. 5 1993 Oxford University Press New York 21
    • (1993) IUCR Monographs on Crystallography , vol.5 , pp. 21


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.