Formation of holographic memory for defect tolerance in optically reconfigurable gate arrays

Applied Optics

Volumn 49, Issue 22, 2010, Pages 4255-4261

  Ogiwara, Akifumi ^a   Watanabe, Minoru ^b   Mabuchi, Takayuki ^b   Kobayashi, Fuminori ^c  

^a KOBE CITY COLLEGE OF TECHNOLOGY   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

^c KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; HOLOGRAPHIC INTERFEROMETRY; HOLOGRAPHY; LIQUID CRYSTALS; LOGIC GATES; OPTICAL DATA PROCESSING;

DEFECT TOLERANCE; FAST RECONFIGURATION; HOLOGRAPHIC MEMORY; HOLOGRAPHIC POLYMER DISPERSED LIQUID CRYSTAL; LIQUID-CRYSTAL COMPOSITES; NOISE RATIO; OPTICALLY RECONFIGURABLE GATE ARRAYS; PROGRAMMABILITY;

RECONFIGURABLE HARDWARE;

EID: 77955877753     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.004255     Document Type: Article

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