Fault tolerance of a dynamic optically reconfigurable gate array with a one-time writable volume holographic memory

Midwest Symposium on Circuits and Systems

Volumn , Issue , 2009, Pages 917-920

  Mabuchi, Takayuk ^a   Miyashiro, Kenji ^b   Watanabe, Minoru ^a   Ogiwara, Akifumi ^c  

^a SHIZUOKA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF TECHNOLOGY   (Japan)

^c KOBE CITY COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT TOLERANCE; FAST RECONFIGURATION; GATE ARRAYS; HIGH RELIABILITY; HOLOGRAPHIC MEMORY; LASER ARRAYS; LASER DIODE ARRAYS; OPTICALLY RECONFIGURABLE GATE ARRAYS; VOLUME HOLOGRAPHIC MEMORIES;

DEFECTS; FAULT TOLERANCE; FAULT TOLERANT COMPUTER SYSTEMS; HOLOGRAPHIC INTERFEROMETRY; QUALITY ASSURANCE; SPACE APPLICATIONS;

LOGIC GATES;

EID: 77950636614     PISSN: 15483746     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSCAS.2009.5235916     Document Type: Conference Paper

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