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Optics Letters

Volumn 35, Issue 16, 2010, Pages 2699-2701

Signal-to-noise performance of a short-wave infrared nanoinjection imager

(5) Memis, Orner Gokalp a Kohoutek, John a Wu, Wei a Gelfand, Ryan M a Mohseni, Hooman a

a Northwestern University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1550 NM; A-FRAMES; AMPLIFICATION MECHANISM; EXCESS NOISE; INTERNAL CHARGE; IR IMAGER; NANOINJECTION; ORDERS OF MAGNITUDE; RESPONSIVITY; SHORT WAVE INFRARED; SHORT WAVES; SIGNAL TO NOISE; THERMOELECTRIC COOLING;

SIGNAL TO NOISE RATIO;

AMPLIFICATION;

EID: 77955873340 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.35.002699 Document Type: Article

Times cited : (19)

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