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Volumn 177, Issue 35-36, 2006, Pages 3157-3160
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Microstructure of Ag2S-As2S3 glasses
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Author keywords
Chalcogenide glasses; Electric force microscopy; Field effect scanning microscopy; Phase separation
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Indexed keywords
ELECTRIC CONDUCTIVITY;
MICROSTRUCTURE;
PHASE SEPARATION;
SCANNING ELECTRON MICROSCOPY;
SILVER COMPOUNDS;
CHALCOGENIDE GLASSES;
ELECTRIC FORCE MICROSCOPY;
FIELD EFFECT SCANNING MICROSCOPY;
GLASS;
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EID: 33750935083
PISSN: 01672738
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ssi.2006.07.054 Document Type: Article |
Times cited : (22)
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References (11)
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