'Collapsing rings' on Schottky electron emitters

Ultramicroscopy

Volumn 110, Issue 9, 2010, Pages 1243-1254

  Bronsgeest, M S ^a   Kruit, P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Schottky electron source

Indexed keywords

BEAM CURRENTS; BEAM DIVERGENCE; BEAM INSTABILITY; ELECTRON EMITTERS; EMISSION PATTERN; ENERGY SPREADS; EXTRACTION VOLTAGE; FIELD ENHANCEMENT FACTOR; GEOMETRY CHANGE; HIGHER TEMPERATURES; IN-BETWEEN; LOCAL FIELDS; LOW FIELD; OPERATING CONDITION; PERIODIC FLUCTUATIONS; REPETITIVE PROCESS; SCANNING ELECTRON MICROSCOPES; SCHOTTKY; SCHOTTKY ELECTRON SOURCE; SCHOTTKY EMITTER; SIZE REDUCTIONS; VIRTUAL SOURCES;

COMPUTATIONAL GEOMETRY; ELECTRON BEAMS; ELECTRON SOURCES; SCANNING ELECTRON MICROSCOPY;

ELECTRONS;

ARTICLE; BRIGHTNESS; CONTROLLED STUDY; ELECTRIC CURRENT; ELECTRIC FIELD; ELECTRIC POTENTIAL; ELECTRON BEAM; ENERGY; FIELD EMISSION; HIGH TEMPERATURE; SCANNING ELECTRON MICROSCOPE; SCHOTTKY ELECTRON EMITTER;

EID: 77955516683     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.05.004     Document Type: Article

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