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Ceramics International

Volumn 36, Issue 7, 2010, Pages 2189-2196

State dependent pyroelectric and thermal expansion coefficients in a PZT wafer

(2) Kim, Sang Joo a Kim, Yong Soo b

a University of Seoul (South Korea)

b Defense Agency for Technology and Quality (South Korea)

Author keywords

Pyroelectric; PZT wafer; Switching; Temperature; Thermal expansion

Indexed keywords

IN-PLANE; IN-PLANE STRAINS; LINEAR FUNCTIONS; PYROELECTRIC COEFFICIENTS; PZT WAFER; QUADRATIC FUNCTION; REFERENCE TEMPERATURE; REMANENT POLARIZATION; STATE-DEPENDENT; SWITCHING TEMPERATURES; TEMPERATURE INCREASE; THERMAL EXPANSION COEFFICIENTS; THICKNESS DIRECTION;

ELECTRIC FIELDS; POLARIZATION; THERMAL STRESS;

THERMAL EXPANSION;

EID: 77955516352 PISSN: 02728842 EISSN: None Source Type: Journal
DOI: 10.1016/j.ceramint.2010.05.026 Document Type: Article

Times cited : (24)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.