Admittance spectroscopy characterize graphite paste for back contact of CdTe thin film solar cells

Science China Technological Sciences

Volumn 53, Issue 9, 2010, Pages 2337-2341

  He, Xulin ^a   Zhang, Jingquan ^a   Feng, Lianghuan ^a   Wu, Lili ^a   Li, Wei ^a   Zeng, Guanggen ^a   Lei, Zhi ^a   Li, Bing ^a   Zheng, Jiagui ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

admittance spectroscopy; CdTe; deep level defect; solar cells

Indexed keywords

CADMIUM TELLURIDE; DEFECTS; ELECTRIC ADMITTANCE; GRAPHITE; II-VI SEMICONDUCTORS; SOLAR CELLS; THIN FILMS;

ADMITTANCE SPECTROSCOPIES; CAPTURE CROSS SECTIONS; CDTE; DEEP-LEVEL DEFECTS; FORBIDDEN BAND; GRAPHITE PASTE; SOLAR CELL PERFORMANCE; THIN FILMS SOLAR CELLS;

THIN FILM SOLAR CELLS;

EID: 77955494153     PISSN: 16747321     EISSN: 18691900     Source Type: Journal    
DOI: 10.1007/s11431-010-4032-2     Document Type: Article

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