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Journal of Materials Science

Volumn 45, Issue 18, 2010, Pages 5071-5076

Core-level shift analysis of amorphous CdTeO x materials

(7) Lizarraga R a Holmstrom E a Amezaga A a Bock, N b Peery, T b Menendez Proupin E c Giannozzi, P d,e

a UNIVERSIDAD AUSTRAL DE CHILE (Chile)

b LOS ALAMOS NATIONAL LABORATORY (United States)

c UNIVERSITY OF CHILE (Chile)

d UNIVERSITY OF UDINE (Italy)

e DEMOCRITOS NATIONAL SIMULATION CENTER (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC CORE; ATOMIC DENSITY; CHARGE REDISTRIBUTION; CORE-LEVEL SHIFT; ELECTRON SPECTRUM; FIRST-PRINCIPLES CALCULATION; GEOMETRICAL ARRANGEMENTS; LOCAL DISTRIBUTIONS; OXYGEN ATOM; VORONOI; X-RAY PHOTO; X-RAY PHOTOEMISSIONS;

EMISSION SPECTROSCOPY; OXYGEN; PHOTOELECTRON SPECTROSCOPY; TELLURIUM; TELLURIUM COMPOUNDS;

ATOMS;

EID: 77955470368 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-010-4419-2 Document Type: Conference Paper

Times cited : (6)

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