Determination of grain size distributions in magnetic recording media by grazing incidence X-Ray diffraction

IEEE Transactions on Magnetics

Volumn 37, Issue 4, 2001, Pages 1947-1949

  Li, Shaoping ^a   Potter, Charles ^a   Palmer, Dean ^a   Eberl, Dennis D ^a   Klemmer, Tim ^a   Spear, Jennifer ^a   Reiss, Celeste ^a   Brown, Daniel ^a   Morrone, Augusto ^a  

^a SEAGATE TECHNOLOGY   (United States)

Author keywords

Grain size distributions; Grain sizes; Grazing angle X Ray diffraction (GIXRD); Magnetic recording media

Indexed keywords

GRAIN SIZE AND SHAPE; PARTICLE SIZE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

GRAZING INCIDENCE X-RAY DIFFRACTION (GIXRD);

MAGNETIC RECORDING;

EID: 0035386472     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.951017     Document Type: Article

References (6)

1. Arrhenius-Neel thermal decay in polycrystalline thin film media
2. MudMaster: A program for calculating crystalline size distributions and strain from the shapes of X-ray diffraction peaks
3. XRD measurement of mean thickness, thickness distribution and strain for illite and illite-smectite crystallines by the Bertaut-Warren-Averbach technique
4. The effect of cold-work distortion and particle size broadening in X-ray patterns
5. Effect of stacking faults on magnetic viscosity in thin film magnetic recording media