Lattice and peak profile parameters in GIXD technique

Solid State Phenomena

Volumn 130, Issue , 2007, Pages 281-286

  Goryczka, Tomasz ^a   Dercz, Grzegorz ^a   Paja̧k, Lucjan ^a   ŁA̧Giewka, Eugeniusz ^a  

^a UNIVERSITY OF SILESIA   (Poland)

Author keywords

GIXD; LeBail refinement; X ray diffraction

Indexed keywords

GEOMETRY; PARAMETER ESTIMATION; RIETVELD REFINEMENT; X RAY DIFFRACTION ANALYSIS;

ASYMMETRICAL GEOMETRY; INCIDENT BEAMS; STRUCTURAL PARAMETERS;

LATTICE CONSTANTS;

EID: 37549020737     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/3-908451-40-x.281     Document Type: Conference Paper

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