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Volumn 645-648, Issue , 2010, Pages 175-178

Sublimation growth and structural characterization of 3C-SiC on hexagonal and cubic SiC seeds

Author keywords

3C SiC nucleation; Sublimation epitaxy; TEM; Twins; VLS

Indexed keywords

BUFFER LAYERS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NUCLEATION; SUBLIMATION; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77955451948     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.645-648.175     Document Type: Conference Paper
Times cited : (18)

References (7)
  • 2
    • 0000058653 scopus 로고
    • doi:10.1063/1.349795
    • W.S. Yoo and H. Matsunami: J. Appl. Phys. Vol. 70 (1991), p. 7124. doi:10.1063/1.349795.
    • (1991) J. Appl. Phys. , vol.70 , pp. 7124
    • Yoo, W.S.1    Matsunami, H.2
  • 3
    • 33646536098 scopus 로고    scopus 로고
    • doi:10.1002/adfm.200500597
    • M. Soueidan and G. Ferro: Adv. Funct. Mater. Vol. 16 (2006), p. 975; doi:10.1002/adfm.200500597.
    • (2006) Adv. Funct. Mater. , vol.16 , pp. 975
    • Soueidan, M.1    Ferro, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.