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Volumn 645-648, Issue , 2010, Pages 175-178
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Sublimation growth and structural characterization of 3C-SiC on hexagonal and cubic SiC seeds
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Author keywords
3C SiC nucleation; Sublimation epitaxy; TEM; Twins; VLS
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Indexed keywords
BUFFER LAYERS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
NUCLEATION;
SUBLIMATION;
SUBSTRATES;
TRANSMISSION ELECTRON MICROSCOPY;
CUBIC SILICON CARBIDE;
SIC BUFFER LAYERS;
SIC SUBSTRATES;
STRUCTURAL CHARACTERIZATION;
SUBLIMATION EPITAXY;
SUBLIMATION GROWTH;
TWINS;
VAPOUR-LIQUID-SOLID MECHANISMS;
SILICON CARBIDE;
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EID: 77955451948
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/MSF.645-648.175 Document Type: Conference Paper |
Times cited : (18)
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References (7)
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