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Volumn 7, Issue 6, 2010, Pages 1718-1720
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Switching characteristics of ZnO based transparent resistive random access memory devices grown by pulsed laser deposition
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Author keywords
Devices; Electrical properties; PLD; ZnO
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Indexed keywords
CONDUCTION MECHANISM;
ELECTRICAL PROPERTY;
IMPURITY DOPING;
LOW COSTS;
LOW POWER;
LOW RESISTANCE;
MEMORY EFFECTS;
METAL OXIDE THIN FILMS;
METAL OXIDES;
NON-VOLATILE;
RESISTANCE SWITCHING;
RESISTIVE RANDOM ACCESS MEMORY;
RESISTIVE SWITCHING;
SWITCHING CHARACTERISTICS;
TWO-STATE;
VISIBLE SPECTRAL REGIONS;
WIDE-BAND-GAP SEMICONDUCTOR;
ZNO;
ELECTRIC PROPERTIES;
METALLIC COMPOUNDS;
OXIDE FILMS;
PULSED LASER DEPOSITION;
PULSED LASERS;
RANDOM ACCESS STORAGE;
SEMICONDUCTOR GROWTH;
SWITCHING;
THIN FILMS;
ZINC OXIDE;
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EID: 77955434789
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200983244 Document Type: Conference Paper |
Times cited : (30)
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References (7)
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