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Volumn 7, Issue 6, 2010, Pages 1718-1720

Switching characteristics of ZnO based transparent resistive random access memory devices grown by pulsed laser deposition

Author keywords

Devices; Electrical properties; PLD; ZnO

Indexed keywords

CONDUCTION MECHANISM; ELECTRICAL PROPERTY; IMPURITY DOPING; LOW COSTS; LOW POWER; LOW RESISTANCE; MEMORY EFFECTS; METAL OXIDE THIN FILMS; METAL OXIDES; NON-VOLATILE; RESISTANCE SWITCHING; RESISTIVE RANDOM ACCESS MEMORY; RESISTIVE SWITCHING; SWITCHING CHARACTERISTICS; TWO-STATE; VISIBLE SPECTRAL REGIONS; WIDE-BAND-GAP SEMICONDUCTOR; ZNO;

EID: 77955434789     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200983244     Document Type: Conference Paper
Times cited : (30)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.