Absolute distance measurement using the frequency comb of a femtosecond laser

CIRP Annals - Manufacturing Technology

Volumn 59, Issue 1, 2010, Pages 555-558

  Hyun, S ^a   Kim, Y J ^a   Kim, Y ^a   Kim, S W ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Interferometry; Metrology; Optical

Indexed keywords

ABSOLUTE DISTANCE MEASUREMENT; ABSOLUTE DISTANCE METROLOGY; CONTINUOUS SCANNING; EXTERNAL-CAVITY LASER DIODES; FEMTO-SECOND LASER; FEMTOSECOND PULSE LASER; FREQUENCY COMBS; MEASUREMENT PRECISION; MULTIPLE WAVELENGTHS; MULTIWAVELENGTH; RB CLOCKS; TIME STANDARD;

DISTANCE MEASUREMENT; ELECTROMAGNETIC PULSE; INDUSTRIAL APPLICATIONS; LIGHT SOURCES; PULSED LASER APPLICATIONS; RUBIDIUM; ULTRASHORT PULSES;

INTERFEROMETRY;

EID: 77955327136     PISSN: 00078506     EISSN: 17260604     Source Type: Journal    
DOI: 10.1016/j.cirp.2010.03.039     Document Type: Article

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