Experimental method for true in situ measurements of shear-coupled grain boundary migration

Scripta Materialia

Volumn 63, Issue 6, 2010, Pages 633-636

  Gorkaya, Tatiana ^a   Burlet, Thomas ^a   Molodov, Dmitri A ^a   Gottstein, Günter ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Bicrystal; Grain boundary migration; In situ measurements; Shear stress

Indexed keywords

BICRYSTAL GRAIN BOUNDARY; ELEVATED TEMPERATURE; EXPERIMENTAL METHODS; GRAIN BOUNDARY MIGRATION; GRAIN BOUNDARY MIGRATIONS; HOT STAGE; IN-SITU MEASUREMENT; IN-SITU OBSERVATIONS; SAMPLE HOLDERS; SCANNING ELECTRON MICROSCOPE;

GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; SCANNING ELECTRON MICROSCOPY; SHEAR STRESS; STRENGTH OF MATERIALS;

BICRYSTALS;

EID: 77955309820     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2010.05.040     Document Type: Article

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