Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction

Applied Surface Science

Volumn 256, Issue 23, 2010, Pages 7311-7315

  Chen, Q ^a   Mao, W G ^a   Zhou, Y C ^a   Lu, C ^b  

^a XIANGTAN UNIVERSITY   (China)

^b CURTIN UNIVERSITY   (Australia)

Author keywords

Residual stress; Thermal barrier coatings; X ray diffraction; Young's modulus

Indexed keywords

ELASTIC MODULI; PLASMA SPRAYING; RESIDUAL STRESSES; SINTERING; SPRAYED COATINGS; THERMAL CYCLING; WEIBULL DISTRIBUTION; X RAY DIFFRACTION; ZIRCONIA;

AIR PLASMA SPRAYED; MEASUREMENT PRECISION; POROUS MICROSTRUCTURE; THERMAL BARRIER COATING (TBCS); TOP COATING; VICKERS; Y2O3 STABILIZED ZRO2;

THERMAL BARRIER COATINGS;

EID: 77955309241     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.05.071     Document Type: Article

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