-
1
-
-
36148998381
-
Determination of impurities in uranium matrices by time-of-flight ICP-MS using matrix-matched method
-
S. Bürger, L. R. Riciputi, D. A. Bostick, Determination of impurities in uranium matrices by time-of-flight ICP-MS using matrix-matched method, J. Radioanal. Nucl. Chem. 274 (2007) 491-505.
-
(2007)
J. Radioanal. Nucl. Chem.
, vol.274
, pp. 491-505
-
-
Bürger, S.1
Riciputi, L.R.2
Bostick, D.A.3
-
2
-
-
0030360041
-
Determination of trace impurities in uranium compounds by ICP-AES after organic extraction
-
S. Marin, S. Cornejo, C. Jara, N. Duran, Determination of trace impurities in uranium compounds by ICP-AES after organic extraction, Fresenius' J. Anal. Chem. 355 (1996) 680-683.
-
(1996)
Fresenius' J. Anal. Chem.
, vol.355
, pp. 680-683
-
-
Marin, S.1
Cornejo, S.2
Jara, C.3
Duran, N.4
-
3
-
-
0019548573
-
Analytical chemistry of fast reactor fuels - A review
-
M. V. Ramaniah, Analytical chemistry of fast reactor fuels - a review, Pure Appl. Chem. 54-4 (1982) 889-908.
-
(1982)
Pure Appl. Chem.
, vol.4-54
, pp. 889-908
-
-
Ramaniah, M.V.1
-
4
-
-
51649149840
-
Determination of oxygen to metal ratio of U-Pu mixed oxides by X-ray diffraction
-
R. Verma, P. R. Roy, Determination of oxygen to metal ratio of U-Pu mixed oxides by X-ray diffraction, Bull. Mater. Sci. 8 (1986) 479-488.
-
(1986)
Bull. Mater. Sci.
, vol.8
, pp. 479-488
-
-
Verma, R.1
Roy, P.R.2
-
5
-
-
38049075313
-
Trace element determination in thorium oxide using total reflection X-ray fluorescence spectrometry
-
N. L. Misra, S. Dhara, V. C. Adya, S. V. Godbole, K. D. Singh Mudher, S. K. Aggarwal, Trace element determination in thorium oxide using total reflection X-ray fluorescence spectrometry, Spectrochim. Acta Part B 63 (2008) 81-85.
-
(2008)
Spectrochim. Acta Part B.
, vol.63
, pp. 81-85
-
-
Misra, N.L.1
Dhara, S.2
Adya, V.C.3
Godbole, S.V.4
Mudher, K.D.S.5
Aggarwal, S.K.6
-
6
-
-
0027542090
-
Light element analysis with a new spectrometer for total reflection X-ray fluorescence
-
C. Streli, H. Aiginger, P. Wobrauschek, Light element analysis with a new spectrometer for total reflection X-ray fluorescence, Spectrochim. Acta Part B 48 (1993) 163-170.
-
(1993)
Spectrochim. Acta Part B.
, vol.48
, pp. 163-170
-
-
Streli, C.1
Aiginger, H.2
Wobrauschek, P.3
-
8
-
-
0001289826
-
Application of X-ray fluorescence analysis with total-reflection (TXRF) in material science
-
M. Hein, P. Hoffmann, K. H. Lieser, H. M. Ortner, Application of X-ray fluorescence analysis with total-reflection (TXRF) in material science, Fresenius' J. Anal. Chem. 343 (1992) 760-764.
-
(1992)
Fresenius' J. Anal. Chem.
, vol.343
, pp. 760-764
-
-
Hein, M.1
Hoffmann, P.2
Lieser, K.H.3
Ortner, H.M.4
-
9
-
-
0000348361
-
Light element trace analysis by means of TXRF using synchrotron radiation
-
C. Streli, Light element trace analysis by means of TXRF using synchrotron radiation, J. Trace microprobe Tech. 13 (1995) 109-117.
-
(1995)
J. Trace Microprobe Tech.
, vol.13
, pp. 109-117
-
-
Streli, C.1
-
10
-
-
0348221812
-
Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL Beamline 3-3: Comparison of droplets with spin coated wafers
-
C. Streli, G. Pepponi, P. Wobrauschek, N. Zoger, P. Pianetta, K. Baur, S. Pahlke, L. Fabry, C. Mantler, B. Kanngießer, W. Malzer, Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL Beamline 3-3: comparison of droplets with spin coated wafers, Spectrochim. Acta Part B 58 (2003) 2105-2112.
-
(2003)
Spectrochim. Acta Part B.
, vol.58
, pp. 2105-2112
-
-
Streli, C.1
Pepponi, G.2
Wobrauschek, P.3
Zoger, N.4
Pianetta, P.5
Baur, K.6
Pahlke, S.7
Fabry, L.8
Mantler, C.9
Kanngießer, B.10
Malzer, W.11
-
11
-
-
4644240652
-
A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis
-
C. Streli, P. Wobrauschek, G. Pepponi, N. Zoeger, A new total reflection X-ray fluorescence vacuum chamber with sample changer analysis using a silicon drift detector for chemical analysis, Spectrochim. Acta Part B 59 (2004) 1199-1203.
-
(2004)
Spectrochim. Acta Part B.
, vol.59
, pp. 1199-1203
-
-
Streli, C.1
Wobrauschek, P.2
Pepponi, G.3
Zoeger, N.4
-
13
-
-
85030578187
-
-
International Atomic Energy Agency, Vienna, AXIL Program, available online at
-
International Atomic Energy Agency, Vienna, AXIL Program, available online at http://www.iaea.org/OurWork/ST/NA/NAAL/pci/ins/xrf/pciXRFdown. php.
-
-
-
-
14
-
-
59349109191
-
Determination of sulphur in uranium matrix by total reflection X-ray fluorescence spectrometry
-
S. Dhara, N. L. Misra, S. K. Aggarwal, Determination of sulphur in uranium matrix by total reflection X-ray fluorescence spectrometry, Spectrochim. Acta Part B 63 (2008) 1395-1398.
-
(2008)
Spectrochim. Acta Part B.
, vol.63
, pp. 1395-1398
-
-
Dhara, S.1
Misra, N.L.2
Aggarwal, S.K.3
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